Defect Migration and Recombination in Nanoindentation of Silica Glass

Authors
Nomura, K., Chen, Y., Kalia, R.K., Nakano, A., Vashishta, P.
Publication Date
Name of Publication Source
AIP - Applied Physics Letters
Publisher
American Institute of Physics
Volume
99
Issue
111906
Page Numbers
doi:10.1063/1.3637052