Defect Migration and Recombination in Nanoindentation of Silica Glass

Authors: 
Nomura, K., Chen, Y., Kalia, R.K., Nakano, A., Vashishta, P.
Publication Date: 
August, 2011
Name of Publication Source: 
AIP - Applied Physics Letters
Publisher: 
American Institute of Physics
Volume: 
99
Issue: 
111906
Page Numbers: 
doi:10.1063/1.3637052
Conference Location: