FIdelity: Efficient Resilience Analysis Framework for Deep Learning Accelerators

Published
Publication 2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
Authors
Yi He, Prasanna Balaprakash, Yanjing Li
Publication Date
Name of Publication Source
2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO)
Publisher
IEEE Xplore
Conference Location
Athens, Greece
DOI
10.1109/MICRO50266.2020.00033
Source Link
https://ieeexplore.ieee.org/document/9251852